Capturing ultrafast light-induced phenomena on the nanoscale: development of a novel time-resolved atomic force microscopy technique
Despite remarkable progress in science and technology, rapid advancements have exposed limitations in many technological domains. A pressing challenge in semiconductor devices, which underpin ultrahigh-speed communications and artificial intelligence (AI), is the development of high-performance devices with a basic structure of 2 nm (nanometer). At this scale, single-atom defect structures and minor electron behavior disturbances … Read more
